Atomic force Microscope

OVERVIEW

원자현미경을 활용해 샘플의 Topography, Morphology를 보며 다양한 기계적 특성 (접착, 강성, 마찰 등) 전기적 특성 (정전 용량, 정전기력, 일함수, 전류 분포도) 등을 연구할 수 있습니다.
SEM,TEM과는 다르게 시료의 전처리가 필요 없어 신속한 측정이 가능하며 Bio, Material, Polymer 등 다양한 분야에서 활용 가능합니다.

Material Field AFM measurement

AFM topography of SiC showing 1.5 nm steps on its surface

Topography on multilayer graphene (scan size : 8um)

KPFM on multilayer graphene (scan size : 8um)

Topography of locally deposited charges on an insulating oxide surface (scan size : 10um)

Conductive AFM on ITO

Magnetic force microscopy on polished stainless steel (scan size : 80um)

Polycarbonate gratings (scan size : 90um , height range : 1.5um)

Copolymer (scan size : 1um , height range : 8nm)

Polymeric glass (scan size : 5um , height range : 16nm)

AFM images of gold film on ceramic grains (scan size : 40um , height range : 200nm)

AFM phase image of a polymer blend (scan size : 20um)

Bio field AFM measurement

High-resolution topography image of double-stranded DNA (dsDNA) adsorbed to mica in buffer solution (110nm)

AFM for dental implants (scan size : 80um , height range :200nm)

Hair surface with Dynamic mode ( scan size : 40um , height range : 3um)

Tissue samples ( scan size : 30um , height range : 4um)

Living Rat-2 cells ( scan size : 60um )

Collagen fibrils ( scan size : 4.35um , height range : 300nm)

Force mapping of living cultured cells

Atomic lattice of mica (7nm)

dsDNA imaged in dynamic force mode

AFM image of linearized plasmid DNA (scan size :2um, height range : 1.4nm)

Video

Nanosurf AFM

Adding AFM in your optical microscope

Nanosurf CoreAFM

Overview and tutorial

Webinar

Introducing DriveAFM high-end AFM system

Webinar

Choosing betweeen scanning probe and scanning electron microscope

Webinar

AFM in the materials and life sciences- theory and applications

Webinar

Picobalance:
Mass measurements with DriveAFM

Functionality overview

DriveAFM

초고사양의 AFM 으로 Bio, Material 등 모든 분야에서 사용할 수 있는 AFM

CleanDrive : 기존에 사용하는 Piezo shaker 대신 photothermal excitation 기술로 ultra low noise 실현
Direct drive -Tip Scanning : Tip scanning 방식으로 샘플의 종류와 무게가 실험에 끼칠 수 있는 영향을 최소화
도립현미경과 호환 가능하여 현미경을 사용해 타겟팅 한 후 해당 지역 바로 측정